Ravi Kumara R.*1 and Ramesh H.L.2
1Department of Studies in Sericulture Science, University of Mysore, Mysuru – 570 006.
2Department of Sericulture, Visveswarapura College of Science, Bangalore – 560 004
Email: chandraravi.seri4@gmail.com
Received-01.06.2022, Revised-14.06.2022, Accepted-25.06.2022
Abstract – Fourteen clonally selected mulberry genotypes were evaluated to estimate the genetic variability, correlation, and path analysis for important leaf yield contributing characters. Analysis of variance revealed significant differences for all the traits under study. In general, PCV estimates were higher than GCV estimates for all the eleven characters studied. High heritability (>60%) accompanied by high genetic advance (>20%) recorded in number of branches/plant, petiole length, leaf area, stem girth, leaf specific weight, leaf moisture retention, leaf thickness, and leaf yield/plant is due to additive gene effects and selection based on these may be effective. correlation studies indicated that total leaf yield/plant had a positive and significant association with all the studied characters except petiole length. Path coefficient analysis revealed that leaf thickness had the highest positive direct effects on leaf yield/plant, suggesting their importance while imposing selection for correlation of leaf yield in mulberry.
Keywords: Correlation, Genetic variability, Heritability, Mulberry, Path analysis
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